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Lehrstuhl für Hochfrequenztechnik

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THz-Laboratory

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THz-Laboratory

600 GHz x4 subharmonic mixer
Material characterization with a THz short pulse system up to 2.5 THz

For developing and characterizing of sub-mmW components and systems the institute has a dedicated THz laboratory. Frequency domain measurement equipment is available with vector network analyzers and spectrum analyzers up to 500 GHz. A fiber-coupled time domain spectrometer allows measurements up to 2,5 THz. A wide range of quasi-optical components such as mirrors, polarizer, quasi-optical multiplexers, refractors and dielectric waveguides allow a wide range of setups including THz measurements in transmission and reflection configuration for radar imaging or non-destructive testing applications.

Contact:

Schür, Jan

Dr.-Ing. Jan Schür, Akad. Dir.

Research Group Leader: Non-Destructive Testing, Material Characterization and THz Technology
  • Telefon: +49 9131 85-27237
  • E-Mail: jan.schuer@fau.de
Lehrstuhl für Hochfrequenztechnik
Cauerstraße 9
91058 Erlangen
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