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  3. EM Material Characterization (MC) and Non-Destructive Testing (NDT) Laboratory

EM Material Characterization (MC) and Non-Destructive Testing (NDT) Laboratory

Bereichsnavigation: Labore
  • 3D µW Interconnects & Components Laboratory
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  • EM Material Characterization (MC) and Non-Destructive Testing (NDT) Laboratory
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  • THz-Laboratory

EM Material Characterization (MC) and Non-Destructive Testing (NDT) Laboratory

In RF systems dielectric materials are not only mechanical but functional components, e.g. as substrate material for planar circuits, dielectric waveguides, RF-agile additive manufacturing or antenna radomes. For the computer aided design of such RF components the knowledge of the dielectric material properties in terms of the permittivity (\varepsilon_\text{r}) and loss tangent (\tan_\delta) are very important. In a wide range of measurement setups ranging from 10 MHz up to 2.5 THz material characterization is possible in the LHFT MC/NDT laboratory. With a special focus on the ISM frequency ranges around 5 GHz, 24 GHz and 77 GHz optimized setups with state-of-the-art accuracy are available. Localization-resolved material characterization allow for non-destructive testing applications and 3D radar imaging.

 

Contact:

Schür, Jan

Dr.-Ing. Jan Schür, Akad. Dir.

Research Group Leader: Non-Destructive Testing, Material Characterization and THz Technology
  • Telefon: +49 9131 85-27237
  • E-Mail: jan.schuer@fau.de
Lehrstuhl für Hochfrequenztechnik
Cauerstraße 9
91058 Erlangen
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