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Friedrich-Alexander-Universität Lehrstuhl für Hochfrequenztechnik LHFT
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Friedrich-Alexander-Universität Lehrstuhl für Hochfrequenztechnik LHFT
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  3. Network & Spectrum Analysis Laboratory

Network & Spectrum Analysis Laboratory

Bereichsnavigation: Laboratories
  • 3D Microwave Assembly & Interconnects Laboratory
  • Antenna design & measurement center
  • Automotive Radar Laboratory
  • Biomedical Photonics Laboratory
  • EM Material Characterization (MC) and Non-Destructive Testing (NDT) Laboratory
  • Embedded Wireless Laboratory
  • Fiber-Bragg-Grating Inscription Laboratory
  • Fiber-Optics Laboratory
  • MRI/EPR-Laboratory
  • Network & Spectrum Analysis Laboratory
  • Optical Communication Laboratory
  • Radar Imaging Laboratory
  • Robotic & Unmanned Vehicle Laboratory
  • Signal Integrity Laboratory
  • THz-Laboratory

Network & Spectrum Analysis Laboratory

The institute has an excellently equipped VNA laboratory with two on-wafer-probe stations. „True Mode“ differential 2-Port measurements are possible up to a frequency of 67 GHz. 2-Port measurements reaching from 10 MHz up to 110 GHz can be done in a single sweep (Agilent PNA-X 67 GHz with frequency extender) incooperating 1 mm coaxial connectors. The on-wafer-stations allow for a temperature dependent characterization of DUTs in the wide range from -40°C to 120°C. Conventional 2-port VNA measurement equipment is available seamlessly up to frequencies of 500 GHz in the designated waveguide bands of WR-12 (60 – 90 GHz), WR-10 (75 – 110 GHz), WR-6 (110 – 170 GHz), WR-5 (140 – 220 GHz), WR-3 (220 – 325 GHz) and WR-2.2 (325 -500 GHz) [according to EIA designation]

Contact:

Dr.-Ing. Jan Schür, Akad. Dir.

Research Group Leader: Non-Destructive Testing, Material Characterization and THz Technology
  • Telefon: +49 9131 85-27237
  • E-Mail: jan.schuer@fau.de

Lehrstuhl für Hochfrequenztechnik
Cauerstraße 9
91058 Erlangen
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